Tag Archive RFSOI

EuroSOI-ULIS (April 2019, Grenoble) + Free FD-SOI RF Technology Workshop for 5G

If you’ve never been, you should put it on your list. EuroSOI is one of those seminal conferences where you get a front-row seat to emerging technologies. It provides an interactive forum for scientists and engineers working in the field of new materials and advanced nanoscale devices. In fact, some of the leading technologies enabled by SOI that are now in the mainstream got their start at this conference. Within a few years of being presented here, the best work continues to evolve and star in the “big” conferences like IEDM and VLSI.

The list of luminaries on the steering and technical committees is a veritable who’s who of the SOI research ecosystem, including two winners of the IEEE Andrew Grove Award: Technical Chair Jean-Pierre Colinge and Sorin Cristoloveanu. So, if you want to get in on the ground floor of next-gen SOI, or just get a look at the early stages of the pipeline, this is a great place to do it.

One of the key objectives is to promote collaboration and partnership between players in academia, research and industry. As such it provides opportunities for cross-fertilization across materials, devices and design. The networking is excellent, and the gala dinner is always an affair to remember.

This year, papers in the following areas have been solicited:

  • Advanced SOI materials and wafers. Physical mechanisms and innovative SOI-like devices
  • New channel materials for CMOS: strained Si, strained SOI, SiGe, GeOI, III-V and high mobility materials on insulator; carbon nanotubes; graphene and other two-dimensional materials.
  • Properties of ultra-thin films and buried oxides, defects, interface quality. Thin gate dielectrics: high-κ materials for switches and memory.
  • Nanometer scale devices: technology, characterization techniques and evaluation metrics for high performance, low power, low standby power, high frequency and memory applications.
  • Alternative transistor architectures including FDSOI, DGSOI, FinFET, MuGFET, vertical MOSFET, Nanowires, FeFET and Tunnel FET, MEMS/NEMS, Beyond-CMOS nanoelectronic devices.
  • New functionalities in silicon-compatible nanostructures and innovative devices representing the More than Moore domain, nanoelectronic sensors, biosensor devices, energy harvesting devices, RF devices, imagers, etc.
  • CMOS scaling perspectives; device/circuit level performance evaluation; switches and memory scaling. Three-dimensional integration of devices and circuits, heterogeneous integration.
  • Transport phenomena, compact modeling, device simulation, front- and back-end process simulation.
  • Advanced test structures and characterization techniques, parameter extraction, reliability and variability assessment techniques for new materials and novel devices.
  • Emerging memory devices.

Accepted papers appear in the conference proceedings in the IEEE Xplore® digital library. The authors of the best papers are invited to submit a longer version for publication in a special issue of Solid-State Electronics. A best paper award will be attributed to the best paper by the SiNANO institute.

EuroSOI-ULIS kicks off a full week of activities in Grenoble. The day after the conference, Incize and Soitec are sponsoring an excellent, free workshop on FD-SOI RF technologies for 5G: materials, devices, circuits and performance. The’ve got a terrific line-up of presentations planned.

And towards the end of the week, there are other important satellite events. The 1st open IRDS International Roadmap for Devices and Systems European Conference (April 4th, 2019) is jointly organized by the USA, Japan and EU, and sponsored by the IEEE and SiNANO Institute. Then the week finishes out with the IEEE ICRC International Conference on Rebooting Computing (April 5th, 2019).

Grenoble the first week of April 2019 is clearly the place to be.

RFSOI Short Course – Great Line-Up! (EuroSOI, March 2018)

RF-SOI is in every smart phone out there, and with 5G, there are lots more applications on the horizon. If you’d like to learn more about designing in RF-SOI, there’s a great short course coming up the day before and in conjunction with the EuroSOI-ULIS Conference in Granada, Spain.

The title of this short course is RFSOI: from basics to practical use of wireless technology. Program and registration details can be found here. The course runs for the full day on Sunday, 18 March 2018.

The talks, which are being given by a stellar line-up of experts, include:

  • RF SOI, fabrication, materials and eco-system – Ionut Radu Director of Advanced R&D, Soitec
  • Fundamentals of RF SOI technology – Jean-Pierre Raskin, Professor, UCL
  • 22nm FDSOI Technology optimized for RF/mmWave Applications – David L. Harame, RF CTO Development and Enablement, GlobalFoundries
  • RF SOI technology and components for 5G connectivity – Christine Raynaud, Program Manager (Business Development – Technology to Design), CEA-Leti
  • Analog and RF design on SOI – Barend van Liempd, Senior Researcher, imec
  • Techniques and tricks for RF measurements on SOI – Andrej Rumiantsev, Director RF Technologies, MPI Corporation
  • FOSS TCAD/EDA tools for advanced SOI-device modeling – Wladek Grabinski, R&D CM Manager, MOS-AK
  • RF design flow for SOI – Ian Dennison, Design Systems Senior Group Director, Cadence

The course is being organized by SOI Consortium members Incize and Soitec.

BTW, this year marks the 4th joint EUROSOI – ULIS Conference. The EuroSOI Conference, which has been ongoing for decades, is well paired with the ULtimate Integration on Silicon Conference. The joint conference provides an interactive forum for scientists and engineers working in the field of SOI technology and advanced nanoscale devices. One of the key objectives is to promote collaboration and partnership between different players from academia, research and industry. As such, it covers technical topics, industry trends and updates from pertinent European programs.

EuroSOI-ULIS will take place 19–21 March 2018 at the University of Granada in Spain. For information on the program and how to register, see the website. Following the conference, the papers will be available at the IEEE Xplore® digital library, and the best papers will be published in a special issue of Solid-State Electronics.

 

 

 

GF: 45nm RF-SOI PDKs for 5G

GlobalFoundries has announced availability of its 45nm RF-SOI technology (read the press release here). Dubbed 45RFSOI, the company says it’s the first 300mm RF solution for next-gen mmWave beamforming applications in future 5G base stations and smart phones.

The technology supports mmWave spectrum operation from 24GHz to 100GHz band, 5x more than 4G operating frequencies.

Skyworks’ CTO Peter Gammel says that the 45RFSOI process, “…is enabling Skyworks to create RF solutions that will revolutionize emerging 5G markets and further advance the deployment of highly integrated RF front-ends for evolving mmWave applications.”

The news was quickly picked up by publications across the industry, with EETimes noting that RFSOI has been a big GF success story.

Production will be at the company’s East Fishkill fab. The PDKs are available now.

The 45RFSOI news follows hard on the heels of GF’s announcement a few days prior that the company is teaming up to build a fab offering 22nm FD-SOI in western China, that it’s expanding its Dresden FD-SOI capability by 40 percent, and that it’s adding new RF-SOI capabilities to its fab in Singapore.

GlobalFoundries is a member of the SOI Industry Consortium.

NXP, Qualcomm, Skyworks to Keynote IoT Theme in Upcoming IEEE SOI-3D-SubVt (S3S) Conference (San Francisco, Oct.’16) – Late News Submissions Open, Advance Program Available

IEEE S3S Conference

10-13 October 2016

Hyatt Regency San Francisco Airport

IEEE SOI3DSubthreshold Microelectronics Technology Unified Conference

Theme: Energy Efficient Technology for the Internet of Things

Late News submissions open and Advance Program available

S3SconflogoThe IEEE S3S Conference brings together 3 key technologies that will play a major role in tomorrow’s industry: SOI, 3D integration, and Subthreshold Microelectronics. The numerous degrees of freedom they allow enable the ultra-low power operation and adjustable performance level mandatory for energy-starved systems, perfectly suiting the needs of the numerous categories of connected devices commonly referred to as the Internet of Things. This natural synergy was made obvious during the talks we listened to during past editions of the conference. For this reason, we adopted “Energy Efficient Technology for the Internet of Things” as the theme of the 2016 IEEE S3S.

This theme will be present throughout the conference. It will start on October 10th with a full day tutorial addressing two important IoT-related topics: Energy Efficient Computing and Communications, and will peak during the Plenary Hot Topics session, focused on the Internet of Things, on Thursday October 13th.

We have an outstanding technical program, including a very strong list of invited speakers, all of them leading authorities from illustrious organizations.

Our Keynote speakers are decision-makers from major industries:

  • Nick Yu, VP, Qualcomm, will explain why “The Homogeneous architecture is a dead fairy tale”
  • Ron Martino, VP, NXP, will present “Advanced Innovation and Requirements for future Smart, Secure and Connected Applications”
  • Peter Gammel, CTO, Skyworks, will describe “RF front end requirements and roadmaps for the IoT”

Several sessions will also be of particular interest to designers and technologists who want to learn about new knobs to implement in their circuits: Two tutorials, related to 3D technology and SOI design respectively and the technical sessions on SOI and Low Voltage Circuit Design.

Applications will be illustrated in our session dedicated to SOI circuit implementations.

ieee_logo_mb_taglineYou can look at our Advance Program to get details about the technical content of the conference, as well as the conference venue and registration.EDS-Logo-Reflex-Blue-e1435737971222

And you still have time to actively participate by submitting a late news paper before August 31st.

The conference has a long tradition of allying technical and social activities.

This will be the case again this year with several dinners & receptions that will give us plenty of opportunities to discuss with our colleagues.

Hyatt Regency San Francisco Airport

Hyatt Regency San Francisco Airport

With its broad scope of technology-related applications and social-oriented environment, the S3S is an excellent venue to meet new people with different but related research interests. It is an efficient way to shed new light on your own focus area, and to sprout new ideas and collaboration themes. It is also a place where industry and academia can exchange about the application of on-going research and tomorrow’s company needs.

Deadline for Late News submissions is

August 31st, 2016

register-now-button

For further information, please visit our website at s3sconference.org or contact the conference manager:

Joyce Lloyd • 6930 De Celis Pl., #36

Van Nuys, CA 91406

T 818.795.3768 • F 818.855.8392 • E manager@s3sconference.org

Soitec board names CEO Boudre Chairman; Auberton-Hervé Chairman Emeritus

Soitec, the world’s SOI wafer leader, announced that the Board of Directors has named André-Jacques Auberton-Hervé as Chairman Emeritus (he founded Soitec together with Jean-Michel Lamure in 1992).

CEO Paul Boudre has been appointed Chairman of Soitec’s Board of Directors.

(Read the press release here.)

Don’t Miss Leti Days and FD-SOI Workshop (Grenoble, 22-26 June)

LetiDaysheader_registration_lowresCEA-Leti, a leading global center for applied research in microelectronics, nanotechnologies and integrated systems, is proudly hosting its 17th LetiDays in Grenoble on June 24–25, 2015, and associated seminars and workshops on June 22nd, 23rd and 26th (click here to go to the registration site).

On June 22-23, Leti will present their first workshop on FD-SOI. This Forum brings together a stellar line-up from academia, semiconductor companies, system design houses and the EDA industry to build a vision of the strategic directions and state-of-the-art in FDSOI IC design. Click here to see the schedule – it’s impressive.

The big themes for this year’s Leti Days are Internet of Things-augmented mobility, and managing connected devices and the services and apps they offer. This also gives Leti a chance to show off their remarkable array of technological breakthroughs in silicon technologies, sensors, telecommunications, power management in wearable systems, health applications, the transport market up to the factory and cities of the future.

The event will feature 40+ conferences, many networking opportunities, a showroom and exhibition halls. You’ll hear and meet market leaders, startups, analysts and Leti technology experts. As with every Leti Days event, you’ll get a comprehensive vision of the latest innovations in key technologies and markets, and be provided with opportunities to complement your roadmaps with Leti expertise.

If you can’t make it to Grenoble, watch for other Leti Days coming up in San Francisco during Semicon West and in Tokyo, among others.

IEEE SOI-3D-Substhreshold (S3S) Conference Issues Call for Papers

The IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (IEEE S3S) has issued the 2015 Call for Papers.

Now in its 3rd year as a combined event, the 2015 IEEE S3S Conference will take place in Sonoma Valley, CA, just north of San Francisco, October 5-8. This industry-wide event will gather together widely known experts, contributed papers and invited talks on three main topics: SOI technology, subthreshold architectures with associated designs and 3D integration. With its 40-year history, the SOI segment continues as world’s premier conference to present and discuss state of the art SOI technical papers.

The 2014 edition was a great success (click here to read about it).  The deadline for submissions for the 2015 conference is April 15, 2015 (click here for complete submission information).

SOI-3D-SubVt (S3S): three central technologies for tomorrow’s mainstream applications

ST further accelerates its FD-SOI ROs* by 2ps/stage, and reduces SRAM’s VMIN by an extra 70mV. IBM shows an apple-to-apple comparison of 10nm FinFETs on Bulk and SOI. AIST improves the energy efficiency of its FPGA by more than 10X and Nikon shows 2 wafers can be bonded with an overlay accuracy better than 250nm.

We learned all this and much more during the very successful 2014 IEEE S3S Conference.

The conference’s 40th edition (first created as the IEEE SOS technology workshop in 1975) was held in San Francisco Oct. 6-9. Dedicated to central technologies for tomorrow’s mainstream applications, the event boasted nearly 80 papers presented over 3 days covering conception, design, simulation, process and characterization of devices and circuits.

 S3S14banner

 

Many of the talks we heard made it very clear that the Internet-of-Things will be the next big market growth segment. It will be enabled by extremely energy-efficient and low-cost technologies in the field of RF-communications, sensors and both embedded and cloud computing. The program of the conference was very well designed to tackle these topics, starting with the short courses on Energy Efficiency and Monolithic 3D, an RF fundamentals & applications class, a MEMS hot topic session and a strong focus on ultra-low power throughout the SubVt sessions.

(Photo credit: Justin Lloyd)

S3S Conference Poster & reception session. (Photo credit: Justin Lloyd)

 The interest of the participants could be seen through an increase in Short Course and Fundamentals Class participation (+20%) compared to last year.

 The companies working in the field of RF communications and mobile chips were well represented, including attendees and presenters coming from Broadcom, MediaTek, Murata, Newlans, Qualcomm, RFMD, Skyworks and TowerJazz.

 

Sub-Threshold Microelectronics

The SubVT portion of the conference featured an extremely strong suite of papers on advancements in subthreshold circuit design including ultra-low-voltage microprocessors, FPGAs, and analog circuits. Additionally, there were sessions on technologies which enable very low voltage computation, such as radiation testing during subthreshold operation, and efficient energy-harvesting devices to allow indefinite operation of IoT systems. A number of talks explored the future of ultra low voltage computing, presenting results from emerging technologies such as Spin Torque Transfer devices and TFETs.

3D Integration

The 3D integration track keeps growing in the conference and is strongly focused on monolithic 3D. A dedicated full day short course was offered again this year, as well as two joint sessions featuring several papers on process integration, design, precision alignment bonders and more. Progress is being made and a lot of interest in this technology is being generated (See the EE Times article).

Key Fully-Depleted SOI Technical results

Planar Fully-Depleted SOI technologies were well represented again this year, in both SOI and Sub-Vt parallel sessions. A full session was also dedicated to FinFETs.

STMicroelectronics and CEA-Leti gave us a wealth of information on:

  • From "Design Strategy for Energy Efficient SOCs in UTBB FD-SOI Technology" in the S3S '14 "Energy Efficiency" short course by P. Flatresse (Source: STMicroelectronics)

    From “Design Strategy for Energy Efficient SOCs in UTBB FD-SOI Technology” in the S3S ’14 “Energy Efficiency” short course by P. Flatresse (Source: STMicroelectronics)

    How to improve your circuit’s efficiency by co-optimizing Vdd, poly-bias and back-gate voltage simultaneously during the circuit design. Picking the correct optimization vector enables you to gain more than 2X in speed or up to 5X in power compared to the non-optimized circuit. (P. Flatresse, “Design Strategy for Energy Efficient SOCs in UTBB FD-SOI Technology” in the “Energy Efficiency” short course). In the same presentation we saw how going to a single-well configuration can help further reduce SRAM’s VMin by 70mV (see graph to the right).

  •  How to use FMAX tracking to maintain optimal Vdd, VBB values during operation. This shows how you can take advantage of both Vdd and VBB dynamic modulation to maintain your circuit’s best performance when external conditions (e.g. temperature, supply voltage…) vary. (E. Beigné, “FDSOI Circuit Design for a Better Energy Efficiency”).

The latest updates on 14nm technology, including an additional 2ps/stage RO delay reduction since the 2014 VLSI results shown last June. This means ROs running faster than 8ps/stage at 10nA/stage of static leakage. The key elements for the 10nm node (sSOI, thinner BOX, replacement gate, next gen. ID-RSD) where also discussed. (M. Haond, “14nm UTBB FD-SOI Technology”).

In the past year we witnessed the foundry announcements for FD-SOI technology offering. Global Foundries very clearly re-stated their interest in the FD-SOI technology, claiming that 28FD-SOI is a good technology for cost sensitive mobile applications, with the cost of 28LP and the performance of 28HPP. However, GF favors a flavor of FD-SOI technology they call Advanced ET-SOI, with similar performance to 20LPM at a reduced cost.

More than An Order of Magnitude Energy Improvement of

From S3S 2014 Best Paper, “More than An Order of Magnitude Energy Improvement of FPGA by Combining 0.4V Operation and Multi-Vt Optimization of 20k Body Bias Domains” (AIST)

The IEEE S3S Conference Best Paper Award went to Hanpei Koike and co-authors from the National Institute of AIST, for their paper entitled “More than An Order of Magnitude Energy Improvement of FPGA by Combining 0.4V Operation and Multi-Vt Optimization of 20k Body Bias Domains,” presented in the SubVT part of the conference. In this work, an FPGA was fabricated in the AIST SOTB (Si On Thin BOX — which is another name for FD-SOI) process, and demonstrated successful operation down to voltages at and below the minimum energy point of the circuit. A 13x reduction in Power-Delay-Product over conventional 1.2V operation was achieved through a combination of low voltage operation and flexible body-biasing, enabled by the very thin BOX.

On the FinFET side, T.B. Hook (IBM) presented a direct comparison of “SOI FinFET versus Bulk FinFET for 10nm and below”, based on silicon data. This is a very unique work in the sense that both technologies are being developed and optimized by the same teams, in the same fab, with the same ground rules, which enables a real apple-to-apple comparison. SOI comes out a better technology in terms of Fin height control (better performance and ION variability), VT mismatch (lower VMin), output conductance (better analog and low voltage perf.) and reliability. Though external stressors are expected to be more efficient in Bulk FinFETs, mobility measurements are only 10% lower for SOI PFETs and are actually 40% higher for SOI NFETs, because of the absence of doping. The devices’ thermal resistance is higher on SOI, though bulk FinFETs are not as immune to self-heating as planar bulk. Both technologies are still competitive down to the 10nm node, but looking forward, bulk’s advantages will be rendered moot by the introduction of high mobility materials and dimensions shrinking, while SOI advantages will keep getting larger.

Experimental SOI vs. Bulk FinFET comparison showing 50% higher VT variability on bulk (grey dots on top graph) as well as mobility difference (lower graphs).

Experimental SOI vs. Bulk FinFET comparison showing 50% higher VT variability on bulk (grey dots on top graph) as well as mobility difference (lower graphs).

FinFET_SOI_IBM_S3S14_Mobility_1

Join the conference in 2015!

Next year, the S3S Conference will be held October 5-8, at the DoubleTree by Hilton Sonoma Wine Country Hotel, Rohnert Park, California.

The organizing committee is looking forward to seeing you there!

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Steven A. Vitale is an Assistant Group Leader in the Quantum Information and Integrated Nanosystems Group at MIT Lincoln Laboratory.  He received his B.S. in Chemical Engineering from Johns Hopkins University and Ph.D. in Chemical Engineering from MIT.  Steven’s current research focuses on developing a fully-depleted silicon-on-insulator (FDSOI) ultra-low-power microelectronics technology for energy-starved systems such as space-based systems and implantable biomedical devices.  Prior to joining MIT-LL, Steven was a member of the Silicon Technology Development group at Texas Instruments where he developed advanced gate etch processes. He has published 26 refereed journal articles and holds 5 patents related to semiconductor processing. From 2011 to 2012 Steven was the General Chair of the IEEE Subthreshold Microelectronics Conference, and is on the Executive Committees of the AVS Plasma Science and Technology Division, the AVS Electronic Materials and Processing Division, and the IEEE S3S Conference.

Frederic Allibert received his MS degree from the National Institute for Applied Sciences (INSA, Lyon, France) in 1997 and his PhD from Grenoble Polytechnic’s Institute (INPG) in 2003, focusing on the electrical characterization of Unibond wafers and the study of advanced device architectures such as planar double-gate and 4-gate transistors.  He was a visiting scientist at KAIST (Taejon, Korea) in 1998 and joined Soitec in 1999.  As an R&D scientist, he implemented SOI-specific electrical measurement techniques (for thin films, multi-layers, high resistivity) and supported the development of products and technologies targeting various applications, including FD-SOI, RF, imagers, and high-mobility materials.  As Soitec’s assignee at the Albany Nanotech Center since 2011, his focus is on substrate technologies for advanced nodes.  He has authored or co-authored over 50 papers and holds over 10 patents.

 

 

*RO = ring oscillator