LogicVision’s ETMemory™
Posted date : May 27, 2009

IBM is including LogicVision’s ETMemory™ memory built-in self test (BIST) and on-chip self-repair solution for embedded memory test and yield improvement within its advanced 45nm SOI foundry flow. The ETMemory solution will be recommended by IBM to its 45nm SOI customers to help them in their own design work.

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