Qcept Technologies’ ChemetriQ® 3000
Posted date : May 27, 2009

Qcept Technologies’ ChemetriQ® 3000, a new breed of non-visual defect (NVD) inspection systems, has been adopted by Soitec, the leading SOI wafer supplier. The ChemetriQ system is being used for incoming quality control of bare silicon wafers and process monitoring of SOI wafers. The two companies have agreed to collaborate on ongoing application development.

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