The INFOS conference is a prestigious bi-annual event addressing the newest developments on thin insulating films on semiconductors.
29 June – 1 July 2009 – Cambridge, UK
www.infos2009.org
- Improved GeOI substrates for pMOSFET off-state leakage control
K. Romanjek, et al. (Leti, IMEP-INP, Soitec)
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