Tag Archive Altatech

Advanced substrates for 3D and other new markets drive new fab inspection equipment – interview with Altatech GM
Posted date : Oct 6, 2015

New approaches in chipmaking and fast-evolving specialty markets are driving the need for new equipment on the fab floor. 3D chips (be they stack

Two additions to Altatech equipment lines: 10x faster ultra-thin film deposition; Doppler nano-defect inspection captures true sizing and positioning
Posted date : Dec 8, 2014

The Orion Lightspeed™ inspection system by Altatech (a division of Soitec) pinpoints the true size and location of nano-scale defects inside c

OSRAM selects Altatech (Soitec) for LED wafer inspection and metrology
Posted date : Apr 25, 2014

Altatech, a subsidiary of Soitec, has received an order for its Orion LedMax wafer inspection and metrology system from OSRAM Opto Semiconductors