Tag Archive equipment

Advanced substrates for 3D and other new markets drive new fab inspection equipment – interview with Altatech GM
Posted date : Oct 6, 2015

New approaches in chipmaking and fast-evolving specialty markets are driving the need for new equipment on the fab floor. 3D chips (be they stack

Two additions to Altatech equipment lines: 10x faster ultra-thin film deposition; Doppler nano-defect inspection captures true sizing and positioning
Posted date : Dec 8, 2014

The Orion Lightspeed™ inspection system by Altatech (a division of Soitec) pinpoints the true size and location of nano-scale defects inside c

OSRAM selects Altatech (Soitec) for LED wafer inspection and metrology
Posted date : Apr 25, 2014

Altatech, a subsidiary of Soitec, has received an order for its Orion LedMax wafer inspection and metrology system from OSRAM Opto Semiconductors

U. Washington Selects Altatech (Soitec) CVD System to Develop New Process Materials
Posted date : Apr 9, 2014

The University of Washington’s Nanofabrication Facility (WNF) is the first North American institution to get an AltaCVD™ chemical vapor

Soitec’s Altatech subsidiary partners with HBZ for solar research, installs new CVD system
Posted date : Feb 28, 2014

Altatech, a CVD/equipment subsidiary of SOI wafer leader Soitec, announced a new collaborative partnership to research and develop materials for