Tag Archive KLA-Tencor

4G/5G Opps for SOI Supply Chain – Workshop Presentations Now Posted

The presentations from the SOI Consortium sponsored workshop held during Semicon West are now posted and freely available on the website – clic

A New Top-Tier FD-SOI Foundry – But Which One?

By Adele Hars, ASN Editor-in-Chief Speculation is mounting following ST’s April 28th announcement that they’d signed on a new first-tier f

FD-SOI Foundations Ready, Say Semi Execs

SOI (especially fully depleted “FD-SOI”) was a hot topic in the video and audio interviews that Debra Vogler of SST released recently. Her

KLA-Tencor says its new WaferSight 2 is the industry’s first enabling wafer suppliers and chipmakers to measure bare wafer flatness

KLA-Tencor says its new WaferSight 2 is the industry’s first enabling wafer suppliers and chipmakers to measure bare wafer flatness, shape,

New Technology Captures Defects of Interest at 45nm

New in-line inspection equipment from KT reaches new heights in accuracy for sorting out cleanable particles from killer defects. At the 45nm n

Achieving High Throughput Inspection of Multiple SOI Wafers

Historically, chipmakers conducting incoming quality control (IQC) on SOI wafers used for advanced logic devices are challenged in inspecting the